Testable Sequential Circuit Design: Partitioning for Pseudoexhaustive Test
نویسندگان
چکیده
In this study, we present an automated algorithm that partitions large sequential VLSI circuits for pseudoexhaustive testing. The partitioning algorithm is based on the primary input cone and fanout value of each node in the circuit. We have developed an optimization process that can be used to find the optimal size of primary input cone and fanout values, to be used for partitioning a given circuit. Experimental results are presented to demonstrate the effectiveness of our work.
منابع مشابه
An Automated Algorithm for Partitioning Sequential VLSI Circuits
This paper presents an automated algorithm that partitions large sequential VLSI circuits for pseudoexhaustive testing. The algorithm utilizes the effect of partitioning on hardware overhead, testing time and the delay of critical path. The pseudoexhaustive testing ensures detection of all detectable faults within individual partitions. We have developed an optimization process that can be used...
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